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54 results found

Scott Mansfield East Fishkill, NY

Professions & Specialties

Model

Experience & Education

United States Patent InventorAppl. No.Assignee

#6602728  Aug 5, 2003

Filed: Jan 5, 2001

Lars W. Liebmann (Poughquag, NY)
Scott Mansfield (Hopewell Junction, NY)
Alfred K. Wong (Pokfulam, HK)
09/754920 International Business Machines Corporation (Armonk, NY)
International Classification: G01R 3126U.S. Classification: 438 16, 438 14, 438 16, 716 5, 716 6, 716 19, 716 20, 716 21
Patent:
Method for generating a proximity model based on proximity rules
Abstract:
A method for generating an optical proximity correction (OPC) model includes generating a set of...
Claim:
We claim: 1. A method for generating an optical proximity correction (OPC) model, comprising: (a)...

Anda Mocuta East Fishkill, NY

Professions & Specialties

Model

Experience & Education

United States Patent InventorAppl. No.Assignee

#8626480  Jan 7, 2014

Filed: Oct 6, 2009

Paul Chang (Mahopac, NY)
Jie Deng (Wappingers Falls, NY)
Terrence B. Hook (Essex Junction, VT)
Sim Y. Loo (Rochester, MN)
Anda C. Mocuta (Hopewell Junction, NY)
Jae-Eun Park (Hopewell Junction, NY)
Kern Rim (Hopewell Junction, NY)
Xiaojun Yu (Hopewell Junction, NY)
12/574440 International Business Machines Corporation (Armonk, NY)
International Classification: G06F 17/50U.S. Classification: 703 14, 703 13
Patent:
Compact model for device/circuit/chip leakage current (IDDQ) calculation including process induced...
Abstract:
A system, method and computer program product for implementing a quiescent current leakage specific ...

Scott Mansfield East Fishkill, NY

Professions & Specialties

Model

Experience & Education

United States Patent InventorAppl. No.Assignee

#7765021  Jul 27, 2010

Filed: Jan 16, 2008

Scott M. Mansfield (Hopewell Junction, NY)
Lars W. Liebmann (Poughquag, NY)
Mohamed Talbi (Poughkeepsie, NY)
12/015077 International Business Machines Corporation (Armonk, NY)
International Classification: G06F 19/00, G06F 17/50, G06K 9/00U.S. Classification: 700108, 716 2, 716 4, 716 12, 716 19, 700110, 703 14, 382169
Patent:
Method to check model accuracy during wafer patterning simulation
Abstract:
A method, and computer program product and system for performing the method, is provided for...

Kern Rim East Fishkill, NY

Professions & Specialties

Model

Experience & Education

United States Patent InventorAppl. No.Assignee

#8626480  Jan 7, 2014

Filed: Oct 6, 2009

Paul Chang (Mahopac, NY)
Jie Deng (Wappingers Falls, NY)
Terrence B. Hook (Essex Junction, VT)
Sim Y. Loo (Rochester, MN)
Anda C. Mocuta (Hopewell Junction, NY)
Jae-Eun Park (Hopewell Junction, NY)
Kern Rim (Hopewell Junction, NY)
Xiaojun Yu (Hopewell Junction, NY)
12/574440 International Business Machines Corporation (Armonk, NY)
International Classification: G06F 17/50U.S. Classification: 703 14, 703 13
Patent:
Compact model for device/circuit/chip leakage current (IDDQ) calculation including process induced...
Abstract:
A system, method and computer program product for implementing a quiescent current leakage specific ...

Dan Prager East Fishkill, NY

Professions & Specialties

Model

Experience & Education

United States Patent InventorAppl. No.Assignee

#2006000  Jan 12, 2006

Filed: Jul 8, 2004

Dan Prager (Hopewell Junction, NY)
Jason Ferns (Sunnyvale, CA)
Lawrence Lane (San Jose, CA)
Dan Engelhard (Mountain View, CA)
10/888726 Timbre Technologies, Inc. (Santa Clara, CA)
International Classification: G06F 19/00U.S. Classification: 700121000, 700108000
Patent:
Optical metrology model optimization for process control
Abstract:
To evaluate the adequacy of a profile model, one or more types of process control to be used in...

Daniel Prager East Fishkill, NY

Professions & Specialties

Model

Experience & Education

United States Patent InventorAppl. No.Assignee

#2005012  Jun 16, 2005

Filed: Dec 12, 2003

Junwei Bao (Fremont, CA)
Vi Vuong (Fremont, CA)
Manuel Madriaga (Santa Clara, CA)
Daniel Prager (Hopewell Junction, NY)
10/735212
International Classification: G01B011/24U.S. Classification: 356601000
Patent:
Parametric optimization of optical metrology model
Abstract:
The profile of an integrated circuit structure is determined by obtaining a measured metrology...

Steven Lovejoy East Fishkill, NY

Professions & Specialties

Model

Experience & Education

United States Patent InventorAppl. No.Assignee

#8032349  Oct 4, 2011

Filed: Jan 25, 2007

Sim Y. Loo (Rochester, MN)
Steven G. Lovejoy (Hopewell Junction, NY)
Myung-Hee Na (Lagrangeville, NY)
Edward J. Nowak (Essex Junction, VT)
Scott K. Springer (Burlington, VT)
11/626915 International Business Machines Corporation (Armonk, NY)
International Classification: G06F 17/50, G06F 7/60U.S. Classification: 703 14, 703 2, 716 54
Patent:
Efficient methodology for the accurate generation of customized compact model parameters from...
Abstract:
Disclosed herein are embodiments of an automated, fast and efficient method of generating a...

Sambit Sahu East Fishkill, NY

Professions & Specialties

Model

Experience & Education

United States Patent InventorAppl. No.Assignee

#2009005  Feb 26, 2009

Filed: Aug 23, 2007

Hani T. Jamjoom (White Plains, NY)
Debanjan Saha (Mohegan Lake, NY)
Sambit Sahu (Hopewell Junction, NY)
Shu Tao (White Plains, NY)
11/844012
International Classification: G06F 11/00U.S. Classification: 714 26, 714E11001
Patent:
METHOD AND APPARATUS FOR EFFICIENT PROBLEM RESOLUTION VIA INCREMENTALLY CONSTRUCTED CAUSALITY MODEL ...
Abstract:
A system for problem resolution in network and systems management includes a database of trouble...

Dan Prager East Fishkill, NY

Professions & Specialties

Model

Experience & Education

United States Patent InventorAppl. No.Assignee

#2007022  Sep 27, 2007

Filed: May 21, 2007

Dan Prager (Hopewell Junction, NY)
Jason Ferns (Sunnyvale, CA)
Lawrence Lane (San Jose, CA)
Dan Engelhard (Mountain View, CA)
11/804998 Timbre Technologies, Inc. (Santa Clara, CA)
International Classification: G06F 19/00U.S. Classification: 700108000, 700121000
Patent:
Optical metrology model optimization for process control
Abstract:
To evaluate the adequacy of a profile model, an initial profile model is selected. The profile...

Daniel Prager East Fishkill, NY

Professions & Specialties

Model

Experience & Education

United States Patent InventorAppl. No.Assignee

#7395132  Jul 1, 2008

Filed: May 21, 2007

Daniel Prager (Hopewell Junction, NY)
Jason Ferns (Sunnyvale, CA)
Lawrence Lane (San Jose, CA)
Dan Engelhard (Mountain View, CA)
11/804998 Timbre Technologies, Inc. (Santa Clara, CA)
International Classification: G06F 19/00U.S. Classification: 700108
Patent:
Optical metrology model optimization for process control
Abstract:
To evaluate the adequacy of a profile model, an initial profile model is selected. The profile...

Jae-Eun Park East Fishkill, NY

Professions & Specialties

Model

Experience & Education

United States Patent InventorAppl. No.Assignee

#8626480  Jan 7, 2014

Filed: Oct 6, 2009

Paul Chang (Mahopac, NY)
Jie Deng (Wappingers Falls, NY)
Terrence B. Hook (Essex Junction, VT)
Sim Y. Loo (Rochester, MN)
Anda C. Mocuta (Hopewell Junction, NY)
Jae-Eun Park (Hopewell Junction, NY)
Kern Rim (Hopewell Junction, NY)
Xiaojun Yu (Hopewell Junction, NY)
12/574440 International Business Machines Corporation (Armonk, NY)
International Classification: G06F 17/50U.S. Classification: 703 14, 703 13
Patent:
Compact model for device/circuit/chip leakage current (IDDQ) calculation including process induced...
Abstract:
A system, method and computer program product for implementing a quiescent current leakage specific ...

Dan Prager East Fishkill, NY

Professions & Specialties

Model

Experience & Education

United States Patent InventorAppl. No.Assignee

#7221989  May 22, 2007

Filed: Jun 20, 2006

Dan Prager (Hopewell Junction, NY)
Jason Ferns (Sunnyvale, CA)
Lawrence Lane (San Jose, CA)
Dan Engelhard (Mountain View, CA)
11/472133 Tokyo Electron Limited (Tokyo)
International Classification: G06F 19/00U.S. Classification: 700108, 438 16
Patent:
Optical metrology model optimization for process control
Abstract:
To evaluate the adequacy of a profile model, one or more types of process control to be used in...

Rama Govindaraju East Fishkill, NY

Professions & Specialties

Model

Experience & Education

United States Patent InventorAppl. No.Assignee

#7840643  Nov 23, 2010

Filed: Oct 6, 2004

Rama K. Govindaraju (Hopewell Junction, NY)
Chulho Kim (Poughkeepsie, NY)
Hanhong Xue (Poughkeepsie, NY)
10/959801 International Business Machines Corporation (Armonk, NY)
International Classification: G06F 15/16U.S. Classification: 709213, 709212, 709217, 709218, 709216, 709219
Patent:
System and method for movement of non-aligned data in network buffer model
Abstract:
A method is provided for transferring data between first and second nodes of a network. Such method ...

Xiaojun Yu East Fishkill, NY

Professions & Specialties

Model

Experience & Education

United States Patent InventorAppl. No.Assignee

#8626480  Jan 7, 2014

Filed: Oct 6, 2009

Paul Chang (Mahopac, NY)
Jie Deng (Wappingers Falls, NY)
Terrence B. Hook (Essex Junction, VT)
Sim Y. Loo (Rochester, MN)
Anda C. Mocuta (Hopewell Junction, NY)
Jae-Eun Park (Hopewell Junction, NY)
Kern Rim (Hopewell Junction, NY)
Xiaojun Yu (Hopewell Junction, NY)
12/574440 International Business Machines Corporation (Armonk, NY)
International Classification: G06F 17/50U.S. Classification: 703 14, 703 13
Patent:
Compact model for device/circuit/chip leakage current (IDDQ) calculation including process induced...
Abstract:
A system, method and computer program product for implementing a quiescent current leakage specific ...

Vasanth Philomin East Fishkill, NY

Professions & Specialties

Model

Experience & Education

United States Patent InventorAppl. No.Assignee

#7076102  Jul 11, 2006

Filed: Jun 27, 2002

Yun-Ting Lin (Ossining, NY)
Srinivas Gutta (Yorktown Heights, NY)
Tomas Brodsky (Croton on Hudson, NY)
Vasanth Philomin (Hopewell Junction, NY)
10/183673 Koninklijke Philips Electronics N.V. (Eindhoven)
International Classification: G06K 9/68U.S. Classification: 382218, 382224, 703 17, 7042561
Patent:
Video monitoring system employing hierarchical hidden markov model (HMM) event learning and...
Abstract:
A method and apparatus are disclosed for automatically learning and identifying events in image...

Daniel Prager East Fishkill, NY

Professions & Specialties

Model

Experience & Education

United States Patent InventorAppl. No.Assignee

#7209798  Apr 24, 2007

Filed: Sep 20, 2004

Asao Yamashita (Wappingers Falls, NY)
Merritt Lane Funk (Austin, TX)
Daniel Prager (Hopewell Junction, NY)
10/944463 Tokyo Electron Limited (Tokyo)
International Classification: G06F 19/00U.S. Classification: 700121, 738714
Patent:
Iso/nested cascading trim control with model feedback updates
Abstract:
This method includes a method for etch processing that allows the bias between isolated and nested...

Soon Joe East Fishkill, NY

Professions & Specialties

Model

Experience & Education

United States Patent InventorAppl. No.Assignee

#2003020  Oct 23, 2003

Filed: Apr 18, 2002

Marvin Rich (Poughkeepsie, NY)
William Mellors (Clinton Corners, NY)
Soon Joe (Hopewell Junction, NY)
10/125217 International Business Machines Corporation (Armonk, NY)
International Classification: G06F017/50U.S. Classification: 703/017000
Patent:
Partitioning a model into a plurality of independent partitions to be processed within a...
Abstract:
A model is partitioned into a plurality of partitions to be processed by a selected number of...

Chai Wu East Fishkill, NY

Professions & Specialties

Model

Experience & Education

United States Patent InventorAppl. No.Assignee

#2013017  Jul 11, 2013

Filed: Jan 9, 2012

Kartheek Chandu (Longmont, CO)
Larry Ernst (Longmont, CO)
Sreenath Rao Vantaram (Rochester, NY)
Mikel J. Stanich (Longmont, CO)
Chai Wah Wu (Hopewell Junction, NY)
13/346231
International Classification: H04N 1/405U.S. Classification: 358 306
Patent:
Halftone Calibration Mechanism Employing an Ink Model
Abstract:
A printing system is disclosed. The printing system includes a halftone calibration system that...

Scott Mansfield East Fishkill, NY

Professions & Specialties

Model

Experience & Education

United States Patent InventorAppl. No.Assignee

#7895547  Feb 22, 2011

Filed: May 1, 2008

Scott M Mansfield (Hopewell Junction, NY)
Geng Han (Fishkill, NY)
Jason E Meiring (New Fairfield, CT)
Dario Gil (Katonah, NY)
12/113374 International Business Machines Corporation (Armonk, NY)
International Classification: G06F 17/50U.S. Classification: 716 19, 716 20, 716 21, 703 14, 430 30
Patent:
Test pattern based process model calibration
Abstract:
Embodiments of the present invention provide a method for performing lumped-process model...

Alexander Wei East Fishkill, NY

Professions & Specialties

Model

Experience & Education

United States Patent InventorAppl. No.Assignee

#8234601  Jul 31, 2012

Filed: May 14, 2010

Amr A. Abdo (Hopewell Junction, NY)
Alexander C. Wei (Hopewell Junction, NY)
12/780011 International Business Machines Corporation (Armonk, NY)
International Classification: G06F 17/50U.S. Classification: 716 55, 716 50, 716 51, 716 54
Patent:
Test pattern for contour calibration in OPC model build
Abstract:
A method of calibrating a lithographic process model is provided. The method includes providing a...

O Park East Fishkill, NY

Professions & Specialties

Model

Experience & Education

United States Patent InventorAppl. No.Assignee

#7732108  Jun 8, 2010

Filed: Sep 30, 2005

O Seo Park (Hopewell Junction, NY)
11/239863 Infineon Technologies AG (Munich)
International Classification: G03F 9/00U.S. Classification: 430 30, 716 19, 716 21
Patent:
Method for OPC model generation
Abstract:
A method for generating or refining an OPC model for use in wafer fabrication. A predetermined...

Amr Abdo East Fishkill, NY

Professions & Specialties

Model

Experience & Education

United States Patent InventorAppl. No.Assignee

#8234601  Jul 31, 2012

Filed: May 14, 2010

Amr A. Abdo (Hopewell Junction, NY)
Alexander C. Wei (Hopewell Junction, NY)
12/780011 International Business Machines Corporation (Armonk, NY)
International Classification: G06F 17/50U.S. Classification: 716 55, 716 50, 716 51, 716 54
Patent:
Test pattern for contour calibration in OPC model build
Abstract:
A method of calibrating a lithographic process model is provided. The method includes providing a...

Nevenko Zunic East Fishkill, NY

Professions & Specialties

ModelSecurity

Experience & Education

United States Patent InventorAppl. No.Assignee

#7890530  Feb 15, 2011

Filed: Feb 5, 2008

Michael P. Bilger (Arlington, TN)
Hyman D. Chantz (Scarsdale, NY)
Nevenko Zunic (Hopewell Junction, NY)
12/025832 International Business Machines Corporation (Armonk, NY)
International Classification: G06F 17/00U.S. Classification: 707781, 707791, 707797
Patent:
Method and system for controlling access to data via a data-centric security model
Abstract:
A method and system for controlling access to data via a data-centric security model. A business...

Regina Sewell East Fishkill, NY

Professions & Specialties

ModelWriterCounselorAdvisorSports TrainerSports TrainersMental Health Care ProfessionalPsychologistBehavioral ConsultantPsychology SpecialistPilotAir Transportation WorkerHospital Care ProfessionalHealth ProfessionalHealth PractitionerPostsecondary TeacherResearcherSurvey Researcher

Experience & Education

Position:
Substance Abuse Counselor at Lexington Center for Recovery, Coach (NY) Mental Health Counselor (OH) ...
Title:
Freelance Writer at www.ReginaSewell.com
Location:
Hopewell Junction, New York
Industry:
Writing and Editing
Work history:
Lexington Center for Recovery - Beacon, NYSubstance Abuse Counselorsince May 2011Mental Health Counselor Coach (NY) Mental Health Counselor (OH)since Apr 2006

Kenneth Yao Fishkill, NY

Professions & Specialties

ModelFinancial AnalystBudget OfficerFinancial Compliance ExaminerAuditorDoctor of MedicineFabricatorProduction WorkerProcess EngineerIndustrial EngineerOperations ManagerSoftware Deployment EngineerSoftware EngineerSoftware DevelopersIT Specialist

Experience & Education

Position:
Financial Analyst - MD Strategy at IBM
Title:
Financial Analyst at IBM
Location:
Fishkill, New York
Industry:
Semiconductors
Work history:
IBM Financial Analyst - MD Strategysince Aug 2010IBM - Hopewell Junction, NYCost AnalystApr 2007 - Aug 2010

William Rooney East Fishkill, NY

Professions & Specialties

Model

Experience & Education

United States Patent InventorAppl. No.Assignee

#6745347  Jun 1, 2004

Filed: Sep 27, 2000

Brent Cameron Beardsley (Tucson, AZ)
William J. Rooney (Hopewell Junction, NY)
Harry Morris Yudenfriend (Poughkeepsie, NY)
09/671416 International Business Machines Corporation (Armonk, NY)
International Classification: G06F 1100U.S. Classification: 714 43, 714 5, 370225
Patent:
System, method and program for determining the availability of interfaces to a device from...
Abstract:
Disclosed is a system, method, and program for analyzing proposed interface ports to a device....
Claim:
What is claimed is: 1. A method for analyzing proposed interface ports to a device, comprising: (i) ...

Raymond Cotto East Fishkill, NY

Professions & Specialties

AnalystAnalystsTeller

Experience & Education

Work

Company:
Merrill lynch - New York, NY
Global wealth management summer analyst
Company:
Hudson valley bank - Yonkers, NY
Teller

Skills

Microsoft Office Excel, Bloomberg, Commodities Futeres Analysis, DCF and Excess Equity Return Model ...

Peter Camporese East Fishkill, NY

Professions & Specialties

Model

Experience & Education

United States Patent InventorAppl. No.Assignee

#6618843  Sep 9, 2003

Filed: Jun 29, 2001

Allan H. Dansky (Poughkeepsie, NY)
Wiren D. Becker (Hyde Park, NY)
Howard H. Smith (Beacon, NY)
Peter J. Camporese (Hopewell Junction, NY)
Kwok Fai Eng (Kingston, NY)
Dale E. Hoffman (Fishkill, NY)
Bhupindra Singh (Wappingers Falls, NY)
09/896269 International Business Machines Corporation (Armonk, NY)
International Classification: G06F 1750U.S. Classification: 716 5, 716 10
Patent:
Method for evaluating decoupling capacitor placement for VLSI chips
Abstract:
A method of evaluating decoupling capacitor placement for Very Large Scale Integrated Chips (VLSI)...
Claim:
What is claimed is: 1. A storage medium encoded with machine readable computer program code for...

Peter Camporese East Fishkill, NY

Professions & Specialties

Model

Experience & Education

United States Patent InventorAppl. No.Assignee

#6618844  Sep 9, 2003

Filed: Jun 29, 2001

Allan H. Dansky (Poughkeepsie, NY)
Wiren D. Becker (Hyde Park, NY)
Howard H. Smith (Beacon, NY)
Peter J. Camporese (Hopewell Junction, NY)
Kwok Fai Eng (Kingston, NY)
Dale E. Hoffman (Fishkill, NY)
Bhupindra Singh (Wappingers Falls, NY)
09/896270 International Business Machines Corporation (Armonk, NY)
International Classification: G06F 1750U.S. Classification: 716 5, 716 10
Patent:
Method for evaluating decoupling capacitor placement for VLSI chips
Abstract:
A method of evaluating decoupling capacitor placement for Very Large Scale Integrated Chips (VLSI)...
Claim:
What is claimed is: 1. A computer data signal for evaluating decoupling capacitance in an...

Kai Feng East Fishkill, NY

Professions & Specialties

Model

Experience & Education

United States Patent InventorAppl. No.Assignee

#7886237  Feb 8, 2011

Filed: Jun 9, 2008

Elie Awad (Essex Junction, VT)
Mariette Awad (Essex Junction, VT)
Kai Di Feng (Hopewell Junction, NY)
12/135231 International Business Machines Corporation (Armonk, NY)
International Classification: G06F 17/50U.S. Classification: 716 1, 716 2
Patent:
Method of generating a functional design structure
Abstract:
A method in a computer-aided design system for generating a functional design model of a circuit...
Claim:
1. A method in a computer-aided design system for generating a functional design model of a circuit ...

Paul Llanos New York, NY

Professions & Specialties

ModelImpersonatorDevelopment DirectorBoard MemberFounderHR ManagerManagement Team ExecutiveOperations ManagerFounding MemberChief ExecutiveCaptainDesignerVolunteerNon-ProfitRacerBachelor of ScienceMechanical Engineering ProfessionalMechanical EngineeringDepartment Store SalespersonRetail ProfessionalRetail Salesperson

Experience & Education

Position:
Product Development Manager at Applied Materials, Member Board of Directors at Lewisboro Soccer...
Title:
Product Development Manager at Applied Materials
Location:
Greater New York City Area
Industry:
Semiconductors
Work history:
Applied Materials - Hopewell Junction, NYProduct Development Managersince Sep 2011Lewisboro Soccer Club Member Board of Directorssince Jan 2012

Edil Hernandez Orlando, FL

Professions & Specialties

ModelEntertainerManagerOperations ManagerCertified Nurse AideNurseNurse PractitionerInformation Technology SpecialistIT Specialist

Experience & Education

Title:
Manager, Business Optimization at accesso
Location:
Orlando, Florida Area
Industry:
Information Technology and Services
Work history:
Walt Disney Parks and Resorts Manager, Operations StaffingOct 2007 - Sep 2011IBM - Hopewell Junction, NYManager, Software Quality Release & Support SystemsMay 2005 - Sep 2007

Brian Johnson New York, NY

Professions & Specialties

ModelEngineerTeam LeaderPartnerOperations ManagerChief ExecutiveCounselorAdvisorResearch AssistantResearcherSurvey ResearcherResearch SpecialistResearch ScientistFinance and Accounting SpecialistAccounting BookkeeperBookkeeperSoftware DeveloperSoftware DevelopersIT Specialist

Experience & Education

Position:
Device Design and Modeling Engineer (Team Lead) at IBM
Title:
Semiconductor Device Modeling Engineer at IBM
Location:
Greater New York City Area
Industry:
Semiconductors
Work history:
IBM - Hopewell Junction, NYDevice Design and Modeling Engineer (Team Lead)since Jun 2006Purdue University - West Lafayette, INGraduate Research AssistantJun 2000 - May 2006
Skills:
Semiconductors, Device Physics, Device Design, Device Modeling, Device Characterization, Team...

Rob Groves New York, NY

Professions & Specialties

ModelSenior Design EngineerHead EngineerEngineering ManagerMatlab DeveloperSoftware DeveloperSoftware DevelopersEngineering TechnicianEquipment Tools Purchasing AgentDepartment Store SalespersonRetail ProfessionalRetail SalespersonTechnicians

Experience & Education

Position:
Senior Engineer at IBM Systems and Technology Group
Title:
Senior Engineer at IBM
Location:
Greater New York City Area
Industry:
Semiconductors
Work history:
IBM Systems and Technology Group - East Fishkill, NYSenior Engineersince 1989GM/Hughes Electronics Engineering TechnicianMay 1986 - May 1989

Artur Sahakyan New Hamburg, NY

Professions & Specialties

ModelSoftware EngineerJava DeveloperInformation Technology SpecialistSoftware DevelopersSoftware DeveloperIT SpecialistTutorMathematicsMathematicianCounselorAdvisorSystems AdministratorComputer Systems AdministratorComputer ScientistsBachelor of ScienceJudge

Experience & Education

Position:
Software Engineer at IBM
Title:
Software Engineer
Location:
Wappingers Falls, New York
Industry:
Information Technology and Services
Work history:
IBM - East Fishkill, NYSoftware Engineersince 2011Brooklyn College - Brooklyn, NYTutor of Mathematics at the Learning Center2008 - 2011
Skills:
WebSphere ILOG JRules Business Rule Management System, Java, C++, C, LATEX, Python, Access,...
Languages:
English, Russian, Armenian

Jin Liu New York, NY

Professions & Specialties

ModelEngineerIntegration EngineerSoftware Deployment EngineerSoftware EngineerSoftware DevelopersCo-OwnerOwnerChief ExecutiveDoctor of Philosophy

Experience & Education

Position:
Process Integration Engineer at IBM
Title:
Advisory Engineer at IBM
Location:
Greater New York City Area
Industry:
Electrical/Electronic Manufacturing
Work history:
IBM - Hopewell Junction, NYProcess Integration Engineersince Jan 2009Georgia Institute of Technology Ph.D. StudentAug 2003 - Nov 2008
Languages:
Chinese

Chenzhou Lian New York, NY

Professions & Specialties

ModelEngineerPackage DesignerCommercial DesignerCertified Nurse AideNurseNurse PractitionerInformation Technology SpecialistIT SpecialistResearcherSurvey ResearcherTour Guide

Experience & Education

Position:
Thermal Engineer at IBM
Location:
Greater New York City Area
Industry:
Electrical/Electronic Manufacturing
Work history:
IBM - Hopewell Junction, NYThermal Engineersince Aug 2010Purdue University - West Lafayette, INVisiting ScholarAug 2009 - Aug 2010
Languages:
Chinese

Hardik Dave New York, NY

Professions & Specialties

ModelBusiness AnalystBusiness Intelligence ProfessionalAnalystAnalystsBusiness ConsultantAdvisorComputer Software ProfessionalSoftware DevelopersSkilled ProfessionalComputer ScientistsIT SpecialistChief Executive

Experience & Education

Position:
Senior Business Analyst - Social Analytics at IBM
Location:
Greater New York City Area
Industry:
Computer Software
Work history:
IBM - East fishkill, NYSenior Business Analyst - Social Analyticssince Jan 2012IBM - East Fishkill, NYSenior Business Analyst - IT Strategy and AnalyticsApr 2008 - Jan 2012
Languages:
English, Hindi, Gujarati

Paulette Kellawon New York, NY

Professions & Specialties

ModelIntegration EngineerSoftware Deployment EngineerSoftware EngineerSoftware DevelopersManagerOperations ManagerArmy SpecialistIT SpecialistIndustrial EngineerTeam MemberManagersDepartment Store SalespersonRetail ProfessionalRetail Salesperson

Experience & Education

Position:
Senior Development Integration Engineer at IBM
Title:
Development & Integration Engineer | Six-sigma Green Belt - DoE, FMEA, Gage RnRs, Control Plans | Tech Transfers | 8Ds
Location:
Greater New York City Area
Industry:
Semiconductors
Work history:
IBM - Hopewell Junction, NYSenior Development Integration Engineersince 2010NXP Semiconductors - Hopewell Junction, NYSenior Development/Integration EngineerJan 2002 - Jun 2009

Subodh Kulkarni Minneapolis, MN

Professions & Specialties

ModelChief Executive OfficerCorporate ExecutiveChief ExecutiveInformation Technology SpecialistIT SpecialistChairpersonVice PresidentOperations ManagerBusiness AdministratorManagersMathematicsMathematicianHead EngineerEngineering Manager

Experience & Education

Position:
CEO at Prism Computational Sciences, CEO at Adent, Inc., BoD member at CyberOptics
Title:
CEO at Prism Computational Sciences
Location:
Greater Minneapolis-St. Paul Area
Industry:
Information Technology and Services
Work history:
Prism Computational Sciences - Madison, Wisconsin AreaCEOsince Jan 2013Adent, Inc. - Greater Minneapolis-St. Paul AreaCEOsince Jul 2012

Joe Pierce New York, NY

Professions & Specialties

ModelDirectorManagerProgram DirectorOperations ManagerFinance and Accounting SpecialistAccounting BookkeeperBookkeeperProject ManagersAccounting ClerkProgrammer AnalystComputer Software ProfessionalInformation Systems AnalystIT AnalystSoftware DevelopersProject ManagerTeam MemberAdvisorManagersBachelor of ScienceMaster of ScienceHigher Education ProfessionalSchool AdministratorEducational Manager

Experience & Education

Position:
Director, Strategic Governance & Planning at MetLife
Location:
Greater New York City Area
Industry:
Financial Services
Work history:
MetLife - Hopewell Junction, NyDirector, Strategic Governance & Planningsince 2009MetLife Director/Program Manager - Global Sourcing Solutions2006 - 2008

Bruce Predatsch New York, NY

Professions & Specialties

ModelIT SpecialistInformation Technology SpecialistJava DeveloperJavaScript DeveloperTechnical Support SpecialistProgrammerComputer ProgrammerSoftware DeveloperSoftware DevelopersSystems Support SpecialistSupport SpecialistsTeam LeaderOperations ManagerComputational ScientistApplications DeveloperComputer Network ProfessionalMobile Application DeveloperComputer ScientistsSoftware EngineerIndustrial EngineerLogistician

Experience & Education

Title:
Senior IT Professional
Location:
Greater New York City Area
Industry:
Information Technology and Services
Work history:
IBM - Poughkeepsie, NYSenior IT Specialist1999 - Jun 2012IBM Global Services - East Fishkill, NYProgrammer, Team Lead1996 - 1999
Certifications:
Oracle Certified Professional, Java SE 6 Programmer, Oracle Certification Program

Chao-chun Liang Albany, NY

Professions & Specialties

ModelEngineerSpeakerSpokespersonRepresentativeChairpersonDirectorChief ExecutiveOperations ManagerDepartment Store SalespersonRetail ProfessionalRetail Salesperson

Experience & Education

Position:
Process modeling Engineer at GLOBALFOUNDRIES
Location:
Albany, New York Area
Industry:
Electrical/Electronic Manufacturing
Work history:
GLOBALFOUNDRIES - Malta, NYProcess modeling Engineersince Jul 2012GLOBALFOUNDRIES - Hopewell Junction, NYProcess modeling EngineerJun 2011 - Jun 2012

Daniel Moore San Francisco, CA

Professions & Specialties

ModelData AnalystMatlab DeveloperData Entry SpecialistData ScientistSoftware DeveloperSoftware DevelopersInstructorPedagogueComputer Software ProfessionalInformation Technology SpecialistIT SpecialistBachelor of ArtsMathematicsResearcherSurvey ResearcherMathematician

Experience & Education

Position:
Senior Data Analyst at Microsoft
Title:
Senior Data Analyst at Microsoft (XBox)
Location:
San Francisco Bay Area
Industry:
Nanotechnology
Work history:
Microsoft - Mountain View, CASenior Data Analystsince Aug 2012IBM - Hopewell Junction, NYDevelopment ScientistJun 2008 - Aug 2012
Skills:
Data Analysis, Microscopy, Scientific Writing, Scientific Computing, Nanotechnology, Nanomaterials, ...
Languages:
Greek

Alan Yost Austin, TX

Professions & Specialties

ModelBusiness Intelligence ProfessionalLeaderBusiness ConsultantAdvisorManagersSenior ManagerInformation Technology DirectorManagerPartnerOperations ManagerChief ExecutiveIT ManagerTeam MemberTechnical SpecialistTechnical Support SpecialistsInspectorDirectorInformation Technology SpecialistIT SpecialistEquipment Tools Purchasing AgentServices ProfessionalSales and Service SpecialistSales AgentSales RepresentativeDepartment Store SalespersonRetail ProfessionalRetail SalespersonState Inspector GeneralState InspectorBachelor of ScienceIndustrial Engineer

Experience & Education

Position:
Senior Manager, IT Business Intelligence & Analytics Staff at Freescale Semiconductor
Title:
CIM, Manufacturing Business Intelligence, Data Warehousing and Analytics Leader
Location:
Austin, Texas Area
Industry:
Semiconductors
Work history:
Freescale Semiconductor - Austin, Texas AreaSenior Manager, IT Business Intelligence & Analytics Staffsince 2011Freescale Semiconductor - Austin, Texas AreaIT/CIM Manager, Data Analysis, Reporting and External Manufacturing2006 - 2011
Skills:
Manufacturing, Semiconductors, Business Intelligence, Data Warehousing, Data Management, Team...

Chong Lee San Jose, CA

Professions & Specialties

DirectorSenior ManagerOperations ManagerCounselorContractorAdvisorCommanderIndependent Business OwnersCourierInformation Technology SpecialistIT Specialist

Experience & Education

Position:
Director, IC design at Altera
Location:
San Jose, California
Industry:
Semiconductors
Work history:
Altera Director, IC designsince Mar 2005Altera Senior Manager, IC DesignMay 2000 - 2005
Skills:
ASIC, IC, EDA, FPGA, Semiconductors, Analog, Integrated Circuit Design, VLSI, Functional Verification
based on C-floating DSP model

Jayakannan Jayapalan Austin, TX

Professions & Specialties

ModelEngineer

Experience & Education

Position:
Engineer at Freescale Semiconductor
Location:
Austin, Texas Area
Industry:
Semiconductors
Work history:
Freescale Semiconductor - Austin, TXEngineersince Sep 2009Freescale-IBM Alliance - East Fishkill, NYEngineerJul 2007 - Sep 2009
Skills:
Device Modeling, CMOS, IC, Semiconductors, ASIC, SoC, Mixed Signal, EDA, VLSI, Analog, Physical...

Heather Han New York, NY

Professions & Specialties

Software DeveloperSoftware EngineerComputer Software ProfessionalSoftware DevelopersElectrical EngineerElectrical EngineeringConstructionCertified Nurse AideNurseNurse PractitionerIT SpecialistResearcherSurvey Researcher

Experience & Education

Position:
Electrical Engineer and Software Developer at IBM
Title:
software developer at ibm
Location:
Greater New York City Area
Industry:
Computer Software
Work history:
IBM - Hopewell Junction, NYElectrical Engineer and Software Developersince Jul 2007IBM - Hopewell Junction, NYElectrical Engineer and Software DeveloperMay 2004 - Jul 2007
Languages:
English, Chinese
..and feasibility of on-chip inductance model

Al Carl Burlington, VT

Professions & Specialties

ModelManagerPartnerOperations ManagerChief ExecutiveProject ManagersProject ManagerIT SecurityIT Specialist

Experience & Education

Position:
Manager, Technology Enablement & Project Management at IBM
Location:
Burlington, Vermont Area
Industry:
Electrical/Electronic Manufacturing
Work history:
IBM - Burlington, Vermont AreaManager, Technology Enablement & Project Managementsince Oct 2011IBM - Burlington, Vermont AreaIT Security Project ManagerSep 2010 - Oct 2011
Skills:
ASIC, IP, Program Management, Integration, Business Analysis, Semiconductors, Team Leadership,...
Certifications:
Project Management Professional, Project Management Institute

James O'neill New York, NY

Professions & Specialties

ModelVice PresidentDirectorChief ExecutiveOperations ManagerDirector of OperationsTechnology ManagerManagerTechnical ManagersSupporting MemberTeam MemberEquipment Tools Purchasing AgentDepartment Store SalespersonRetail ProfessionalRetail SalespersonEngineering ManagerProcess EngineerIndustrial EngineerDoctor of PhilosophyBachelor of ScienceInformation Technology SpecialistIT Specialist

Experience & Education

Position:
Sr. Vice President, Electronic Materials at ATMI
Location:
Greater New York City Area
Industry:
Chemicals
Work history:
ATMI - Danbury, CTSr. Vice President, Electronic Materialssince Jan 2012IBM Microelectronics Division - East Fishkill, NYDirector, 14nm CMOS Technology DevelopmentOct 2010 - Jan 2012



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